TIME-RESOLVED SCANNING-TUNNELING-MICROSCOPY THROUGH TUNNEL DISTANCE MODULATION

被引：24

作者：

FREEMAN, MR

NUNES, G

机构：

[1] IBM Thomas J. Watson Research Center, Yorktown Heights

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 19期

关键词：

D O I：

10.1063/1.110404

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The ability to perform time-resolved measurements of fast transient signals with a scanning tunneling microscope has been achieved through direct control of the tunneling distance on short time scales. Modulation of the tip-sample separation is provided by the use of a magnetostrictive tip driven by a local magnetic field coil. The technique offers a broadly applicable means of obtaining fast dynamical information in tunneling microscopy, and is demonstrated here on nanosecond time scales.

引用

页码：2633 / 2635

页数：3

共 12 条

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