PICOSECOND ELECTRICAL SAMPLING USING A SCANNING FORCE MICROSCOPE

被引：93

作者：

HOU, AS

HO, F

BLOOM, DM

机构：

[1] Edward L. Ginzton Laboratory, Stanford University, Stanford

来源：

ELECTRONICS LETTERS | 1992年 / 28卷 / 25期

关键词：

VOLTAGE MEASUREMENT; FORCE MEASUREMENT; MICROSCOPY;

D O I：

10.1049/el:19921481

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A scanning force microscope probe for measuring ultrafast voltage signals is demonstrated. The new technique is based on mixing due to the square-law force interaction present between the microscope tip and sample. Correlation of 100 ps pulses and mixing up to 20 GHz have been achieved.

引用

页码：2302 / 2303

页数：2

共 4 条

[1] POTENTIOMETRY FOR THIN-FILM STRUCTURES USING ATOMIC FORCE MICROSCOPY
ANDERS, M
MUCK, M
HEIDEN, C
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1990, 8 (01): : 394 - 399
[2] HIGH-RESOLUTION CAPACITANCE MEASUREMENT AND POTENTIOMETRY BY FORCE MICROSCOPY
MARTIN, Y
ABRAHAM, DW
WICKRAMASINGHE, HK
[J]. APPLIED PHYSICS LETTERS, 1988, 52 (13) : 1103 - 1105
[3] SHAKOURI MS, 1991, 38TH 1991 ARFTG C SA
[4] SCANNING CAPACITANCE MICROSCOPY ON A 25 NM SCALE
WILLIAMS, CC
HOUGH, WP
RISHTON, SA
[J]. APPLIED PHYSICS LETTERS, 1989, 55 (02) : 203 - 205

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