PICOSECOND ELECTRICAL SAMPLING USING A SCANNING FORCE MICROSCOPE

被引:93
作者
HOU, AS
HO, F
BLOOM, DM
机构
[1] Edward L. Ginzton Laboratory, Stanford University, Stanford
关键词
VOLTAGE MEASUREMENT; FORCE MEASUREMENT; MICROSCOPY;
D O I
10.1049/el:19921481
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A scanning force microscope probe for measuring ultrafast voltage signals is demonstrated. The new technique is based on mixing due to the square-law force interaction present between the microscope tip and sample. Correlation of 100 ps pulses and mixing up to 20 GHz have been achieved.
引用
收藏
页码:2302 / 2303
页数:2
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