AUTOMATED MICRO-RAMAN MAPPING AND IMAGING APPLIED TO SILICON DEVICES AND ZIRCONIA CERAMIC STRESS AND GRAIN-BOUNDARY MORPHOLOGY

被引:16
作者
BOWDEN, M [1 ]
DICKSON, GD [1 ]
GARDINER, DJ [1 ]
WOOD, DJ [1 ]
机构
[1] NEWCASTLE POLYTECH,DEPT CHEM & LIFE SCI,ELLISON PL,NEWCASTLE TYNE NE1 8ST,TYNE & WEAR,ENGLAND
关键词
RAMAN SPECTROSCOPY; SURFACE ANALYSIS; SPECTROSCOPIC TECHNIQUES;
D O I
10.1366/0003702904417544
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An automated, point-by-point, Raman mapping and imaging system is described that combines a 0.5-mu-m stepper-motor-driven stage, a Raman microscope, and a filter spectrograph with an intensified diode array detector. High-resolution Raman images of a silicon device structure and a map showing the presence of the monoclinic phase of zirconia (ZrO2) at grain boundaries and in stressed regions of a sinstered tetragonally stabilized ceramic are reported. The importance of image processing is demonstrated and emphasised.
引用
收藏
页码:1679 / 1684
页数:6
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