X-RAY REFLECTOMETER FOR STUDY OF POLYMER THIN-FILMS AND INTERFACES

An X-ray reflectometer for studying polymer thin films and interfaces is described. Reflectivities may be measured over seven of magnitude with good resolution in both reflection and scattering geometries. The apparatus may be used to determine film thickness, average film density or density profile perpendicular to an interface, and microroughnesses at the corresponding interfaces. Results are presented for the characterization of a thin poly (styrene) film and the determination of interface width between thin films of poly (p-bromostyrene) and poly(styrene). © 1990.