OPTICAL REFLECTOMETRY WITH MICROMETER RESOLUTION FOR THE INVESTIGATION OF INTEGRATED OPTICAL-DEVICES

被引：26

作者：

BEAUD, P ^{[1
]}

SCHUTZ, J ^{[1
]}

HODEL, W ^{[1
]}

WEBER, HP ^{[1
]}

GILGEN, HH ^{[1
]}

SALATHE, RP ^{[1
]}

机构：

[1] SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND

来源：

关键词：

D O I：

10.1109/3.17341

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：755 / 759

页数：5

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