INDEX OF REFRACTION MEASUREMENT ON SAPPHIRE AT LOW-TEMPERATURES AND VISIBLE WAVELENGTHS

被引：66

作者：

DEFRANZO, AC

PAZOL, BG

机构：

[1] Itek Optical Systems, Division of Litton Industries, Lexington, MA, 02173

来源：

APPLIED OPTICS | 1993年 / 32卷 / 13期

关键词：

D O I：

10.1364/AO.32.002224

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The ordinary and extraordinary refractive index of two samples of sapphire, which differed in the way each was grown, was measured. The measurements were made over a wavelength range of 477-701 nm and a temperature range of 20-295 K. A three-term Sellmeier dispersion equation was fit to the data to permit refractive-index interpolation within several parts in 10(4). The data of index versus temperature were fit to a model and the results of dn/dT versus temperature are given along with certain physical constants that were extracted from the model.

引用

页码：2224 / 2234

页数：11

共 25 条

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