CARRIER ESCAPE MECHANISMS FROM GAAS/ALXGA1-XAS MULTIPLE-QUANTUM WELLS IN AN ELECTRIC-FIELD

被引:28
作者
FOX, AM
ISPASOIU, RG
FOXON, CT
CUNNINGHAM, JE
JAN, WY
机构
[1] UNIV NOTTINGHAM,DEPT PHYS,NOTTINGHAM NG7 2RD,ENGLAND
[2] AT&T BELL LABS,HOLMDEL,NJ 07733
关键词
D O I
10.1063/1.110272
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have studied the vertical transport mechanisms in GaAs/AlxGa1-xAs multiple quantum wells in electric fields from the temperature dependence of the photocurrent. On heating from 10 K, we observed a decrease in the photocurrent up to approximately 100 K, followed by a steady increase up to room temperature. The decrease is shown to be consistent with charged-impurity-assisted nonresonant tunneling which varies as T-1/2 in two dimensions, while the increase is consistent with thermal emission. The low field activation energy measured in a sample with x=0.33 is consistent with the thermal emission of heavy holes.
引用
收藏
页码:2917 / 2919
页数:3
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