ATOMIC-SCALE CONNECTIVE NECK FORMATION AND CHARACTERIZATION

被引：54

作者：

AGRAIT, N

RODRIGO, JG

SIRVENT, C

VIEIRA, S

机构：

[1] Laboratorio de Bajas Temperaturas, Departamento de Física de la Materia Condensada, C-III, Universidad Autónoma de Madrid

来源：

PHYSICAL REVIEW B | 1993年 / 48卷 / 11期

关键词：

D O I：

10.1103/PhysRevB.48.8499

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A scanning tunneling microscope is used to form a connective neck of atomic size between a lead substrate and a lead tip. The elongation and contraction of the neck results in a regular and reproducible staircase structure in the tip-substrate conductance vs tip-displacement curve, giving physical insight on the plastic and elastic deformation mechanisms involved in atomic-scale structures.

引用

页码：8499 / 8501

页数：3

共 19 条

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