ION-BEAM INDUCED ATOMIC MIXING IN A SINGLE INTERFACE FE-GE STRUCTURE - CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY STUDY

被引：10

作者：

PATANKAR, J ^{[1
]}

BHANDARKAR, YV ^{[1
]}

KANETKAR, SM ^{[1
]}

OGALE, SB ^{[1
]}

BHIDE, VG ^{[1
]}

机构：

[1] UNIV POONA,SCH ENERGY STUDIES,POONA 411007,MAHARASHTRA,INDIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1985年 / 7-8卷 / MAR期

关键词：

D O I：

10.1016/0168-583X(85)90459-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：720 / 726

页数：7

共 17 条

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[5]

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[7] SOME PROPERTIES OF SUPPORTED SMALL ALPHA-FE203 PARTICLES DETERMINED WITH MOSSBAUER EFFECT [J].

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[8] ION-BEAM MIXING OF METAL-SEMICONDUCTOR EUTECTIC SYSTEMS [J].

LAU, SS ;

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[9] CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY ON THIN AMORPHOUS FEGE FILMS [J].

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DAVER, H .

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[10]

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