DEPENDENCE OF CHANNEL ELECTRIC-FIELD ON DEVICE SCALING

被引：102

作者：

CHAN, TY

KO, PK

HU, C

机构：

来源：

IEEE ELECTRON DEVICE LETTERS | 1985年 / 6卷 / 10期

关键词：

D O I：

10.1109/EDL.1985.26226

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：551 / 553

页数：3

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