AUTOMATIC SYSTEM FOR LOW-TEMPERATURE ELECTRICAL MEASUREMENTS ON SEMICONDUCTORS

被引：6

作者：

BLOOD, P ^{[1
]}

HEADON, RF ^{[1
]}

机构：

[1] MULLARD RES LABS,REDHILL,SURREY,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1975年 / 8卷 / 11期

关键词：

D O I：

10.1088/0022-3735/8/11/021

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：958 / 963

页数：6

共 11 条

[1]

Blakemore J. S., 1962, SEMICONDUCTOR STATIS

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REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (07) :1030-&

[3] APPARATUS FOR AUTOMATIC ELECTRICAL MEASUREMENTS ON SEMICONDUCTORS FROM LIQUID HELIUM TEMPERATURE TO 400 DEGREES K [J].

ELLIOTT, CT ;

WILSON, DJ .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (11) :956-&

[4] CALIBRATION AND USE OF GERMANIUM RESISTANCE THERMOMETERS FOR PRECISE HEAT CAPACITY MEASUREMENTS FROM 1 TO 25 DEGREES K HIGH PURITY COPPER FOR INTERLABORATORY HEAT CAPACITY COMPARISONS [J].

OSBORNE, DW ;

FLOTOW, HE ;

SCHREINER, F .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (02) :159-+

[5] A SIMPLE APPARATUS FOR RECORDING THE VARIATION OF HALL COEFFICIENT WITH TEMPERATURE [J].

PUTLEY, EH .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1956, 33 (04) :164-164

[6]

PUTLEY EH, 1968, HALL EFFECT SEMICOND

[7] COMPUTER CONTROLLED AUTOMATIC SYSTEM FOR MEASURING CONDUCTIVITY AND HALL EFFECT IN SEMICONDUCTING SAMPLES [J].

SHEWCHUN, J ;

GHANEKAR, KM ;

YAGER, R ;

BARBER, HD ;

THOMPSON, D .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (12) :1797-&

[8]

van der Pauw L. J., 1958, PHILIPS RES REP, V1958, P1

[9]

WHITE GK, 1968, EXPTL TECHNIQUES LOW, P185

[10] IONIZED IMPURITY DENSITY IN N-TYPE GAAS [J].

WOLFE, CM ;

STILLMAN, GE ;

DIMMOCK, JO .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (02) :504-&

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