ON AREA AND YIELD CONSIDERATIONS FOR FAULT-TOLERANT VLSI PROCESSOR ARRAYS

被引：37

作者：

KOREN, I ^{[1
]}

BREUER, MA ^{[1
]}

机构：

[1] UNIV SO CALIF,DEPT ELECT ENGN SYST,LOS ANGELES,CA 90007

来源：

关键词：

D O I：

10.1109/TC.1984.5009312

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：21 / 27

页数：7

共 8 条

[1]

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[2]

Carter W. C., 1977, 7th Annual International Conference on Fault-Tolerant Computing, P117

[3] FAULT-TOLERANT 64K DYNAMIC RANDOM-ACCESS MEMORY [J].

CENKER, RP ;

CLEMONS, DG ;

HUBER, WR ;

PETRIZZI, JB ;

PROCYK, FJ ;

TROUT, GM .

[4]

CLIFF RA, 1980, IEEE T COMPUT, V29, P125, DOI 10.1109/TC.1980.1675536

[5]

Gay F. A., 1979, Ninth Annual International Symposium on Fault-Tolerant Computing, P51

[6]

KOREN I, 1981, 8TH P S COMP ARCH, P426

[7]

SEDMAK RM, 1980, IEEE T COMPUT, V29, P492, DOI 10.1109/TC.1980.1675608

STAPPER, CH ;

MCLAREN, AN ;

DRECKMANN, M .