YIELD MODEL FOR PRODUCTIVITY OPTIMIZATION OF VLSI MEMORY CHIPS WITH REDUNDANCY AND PARTIALLY GOOD PRODUCT

被引：142

作者：

STAPPER, CH

MCLAREN, AN

DRECKMANN, M

机构：

来源：

关键词：

D O I：

10.1147/rd.243.0398

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：398 / 409

页数：12

共 24 条

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