共 34 条
[1]
ABELES F, 1967, ADV OPTICAL TECHNIQU, P145
[2]
ALLEN SD, 1984, NBS SPEC PUBL, V669, P65
[4]
Beckmann P., 1963, SCATTERING ELECTROMA
[5]
SCATTERING CHARACTERISTICS OF OPTICAL-MATERIALS
[J].
OPTICAL ENGINEERING,
1978, 17 (05)
:480-488
[6]
STRUCTURE-RELATED OPTICAL CHARACTERISTICS OF THIN METALLIC-FILMS IN VISIBLE AND ULTRAVIOLET
[J].
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY,
1976, 80 (04)
:643-658
[7]
BENNETT JM, 1983, P SOC PHOTO-OPT INST, V401, P234, DOI 10.1117/12.935524
[8]
MEASUREMENT OF RMS ROUGHNESS, AUTOCOVARIANCE FUNCTION AND OTHER STATISTICAL PROPERTIES OF OPTICAL SURFACES USING A FECO SCANNING INTERFEROMETER
[J].
APPLIED OPTICS,
1976, 15 (11)
:2705-2721
[9]
STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES
[J].
APPLIED OPTICS,
1981, 20 (10)
:1785-1802