New ultra-high-frequency plasma source for large-scale etching processes

被引:63
作者
Samukawa, S
Nakagawa, Y
Tsukada, T
Ueyama, H
Shinohara, K
机构
[1] ANELVA CORP,FUCHU,TOKYO 183,JAPAN
[2] NIHON KOSHUHA CO LTD,YOKOHAMA,KANAGAWA 226,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1995年 / 34卷 / 12B期
关键词
ultra-high-frequency discharge; large-scale plasma source; low electron temperature; high-density plasma;
D O I
10.1143/JJAP.34.6805
中图分类号
O59 [应用物理学];
学科分类号
摘要
A low temperature, uniform, high-density plasma is produced by an ultra-high-frequency (UHF) discharge using a new spokewise antenna. The plasma is uniform within +/-5% over a diameter of 30 cm. The plasma density, 1 x 10(11) cm(-3), for low electron temperatures of 1.5-2.0 eV, is almost proportional to tile UHF power even at a low UHF power. No magnetic field is needed to maintain a high-density plasma. Consequently, the plasma source is fairly simple and lightweight. The plasma source can accomplish a notch-free poly-Si etching profile with a high etching rate at a narrow space pattern of less than 0.3 mu m.
引用
收藏
页码:6805 / 6808
页数:4
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