INVESTIGATION OF CRYSTALLINE POLYMERIC SOLIDS AT REDUCED BEAM DAMAGE IN THE HIGH-VOLTAGE ELECTRON-MICROSCOPE

被引：12

作者：

MICHLER, GH ^{[1
]}

DIETZSCH, C ^{[1
]}

机构：

[1] ACAD SCI GDR,INST FESTKORPERPHYS & ELEKTROENMIKROSKOPIE,DDR-4010 HALLE,GER DEM REP

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 1982年 / 17卷 / 10期

关键词：

D O I：

10.1002/crat.2170171012

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：1241 / 1254

页数：14

共 36 条

[1]

ABRAMOVA IM, 1980, VYSOKOMOL SOEDIN A+, V22, P707

[2] MICROSTRUCTURE OF BULK POLYMERS AS REVEALED IN ULTRATHIN SECTIONS [J].

ANDREWS, EH ;

BENNETT, MW ;

MARKHAM, A .

JOURNAL OF POLYMER SCIENCE PART A-2-POLYMER PHYSICS, 1967, 5 (6PA2) :1235-&

[3]

BAIER P, 1980, 7TH P EUR C EL MICR, V2, P638

[4]

BOUDET A, 1978, 9TH P INT C EL MICR, V1, P498

[5]

BOX HC, 1975, PHYSICAL ASPECTS ELE, P279

[6] BEAM-INDUCED CONTRAST IN ELECTRON-MICROSCOPE IMAGES OF POLYMERS AS OBSERVED IN ULTRATHIN SECTIONS [J].

DLUGOSZ, J ;

KELLER, A .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (12) :5776-&

[7] REDUCTION OF BEAM DAMAGE BY CRYOPROTECTION AT 4K [J].

DUBOCHET, J ;

KNAPEK, E ;

DIETRICH, I .

ULTRAMICROSCOPY, 1981, 6 (01) :77-80

[8]

Glaeser R. M., 1975, PHYSICAL ASPECTS ELE, P205

[9] ORIGIN OF CONTRAST EFFECTS IN ELECTRON-MICROSCOPY OF POLYMERS .2. POLYETHYLENE SPHERULITES [J].

GRUBB, DT ;

KELLER, A .

JOURNAL OF MATERIALS SCIENCE, 1972, 7 (07) :822-&

[10] ORIGIN OF CONTRAST EFFECTS IN ELECTRON-MICROSCOPY OF POLYMERS .1. POLYETHYLENE SINGLE-CRYSTALS [J].

GRUBB, DT ;

GROVES, GW ;

KELLER, A .

JOURNAL OF MATERIALS SCIENCE, 1972, 7 (02) :131-&

← 1 2 3 4 →