DIELECTRIC-BREAKDOWN STUDY OF THIN LA2O3 FILMS

[1] THICKNESS DEPENDENCE OF BREAKDOWN FIELD IN THIN FILMS [J]. THIN SOLID FILMS, 1971, 8 (05) : 377 - +

[2] AUSTEN EW, 1940, P PHYS SOC LOND A, V176, P33

[3] BUDENSTEIN PP, 1968, J VAC SCI TECHNOL, V6, P289

[4] Campbell C. K., 1970, Thin Solid Films, V6, P197, DOI 10.1016/0040-6090(70)90039-8

[5] DIELECTRIC-PROPERTIES OF ELECTRON-BEAM-EVAPORATED ND2O3 THIN-FILMS [J]. THIN SOLID FILMS, 1982, 87 (02) : 119 - 126

[6] ELECTRICAL BREAKDOWN IN THIN DIELECTRIC FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 518 - +

[7] THICKNESS INFLUENCE IN BREAKDOWN PHENOMENA OF THIN DIELECTRIC FILMS [J]. PHYSICA STATUS SOLIDI, 1964, 4 (02): : 311 - 324

[8] FRANZ W, 1956, HDB PHYSIK, V17, P155

[9] On the dielectric strength of mixed crystals [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1941, 178 (A975) : 0493 - 0498

[10] FROMHOLD AT, 1976, ELECTROCOMP SCI TECH, V3, P31

[1] THICKNESS DEPENDENCE OF BREAKDOWN FIELD IN THIN FILMS [J]. THIN SOLID FILMS, 1971, 8 (05) : 377 - +

[2] AUSTEN EW, 1940, P PHYS SOC LOND A, V176, P33

[3] BUDENSTEIN PP, 1968, J VAC SCI TECHNOL, V6, P289

[4] Campbell C. K., 1970, Thin Solid Films, V6, P197, DOI 10.1016/0040-6090(70)90039-8

[5] DIELECTRIC-PROPERTIES OF ELECTRON-BEAM-EVAPORATED ND2O3 THIN-FILMS [J]. THIN SOLID FILMS, 1982, 87 (02) : 119 - 126

[6] ELECTRICAL BREAKDOWN IN THIN DIELECTRIC FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 518 - +

[7] THICKNESS INFLUENCE IN BREAKDOWN PHENOMENA OF THIN DIELECTRIC FILMS [J]. PHYSICA STATUS SOLIDI, 1964, 4 (02): : 311 - 324

[8] FRANZ W, 1956, HDB PHYSIK, V17, P155

[9] On the dielectric strength of mixed crystals [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1941, 178 (A975) : 0493 - 0498

[10] FROMHOLD AT, 1976, ELECTROCOMP SCI TECH, V3, P31