KIRKPATRICK-BAEZ MICROSCOPE BASED ON A BRAGG-FRESNEL X-RAY MULTILAYER FOCUSING SYSTEM

被引:13
作者
DHEZ, P
ERKO, A
KHZMALIAN, E
VIDAL, B
ZINENKO, V
机构
[1] FAC SCI & TECH ST JEROME,OPT ELECTROMAGNET LAB,F-13397 MARSEILLE,FRANCE
[2] RUSSIAN ACAD SCI,INST MICROELECTR TECHNOL & HIGH PUR MAT,CHERNOGOLOVKA 142432,USSR
来源
APPLIED OPTICS | 1992年 / 31卷 / 31期
关键词
X-RAY; FOCUSING GRATING; MULTILAYERED MIRROR;
D O I
10.1364/AO.31.006662
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We demonstrate how to use a cylindrical Bragg-Fresnel multilayer focusing system instead of spherical mirrors for two-dimensional focalization. We performed our tests at 8 keV with a collimated x-ray tube having an apparent anode source size of 75 mum x 100 mum. These tests demonstrate that focalization can be obtained within <20 mum. This offers new possibilities in optical systems for collimators and fine focusing of x-rays, especially for synchrotron radiation sources.
引用
收藏
页码:6662 / 6668
页数:7
相关论文
共 18 条
[1]  
ARISTOV VV, 1986, JETP LETT+, V44, P265
[2]  
ARISTOV VV, 1987, PISMA ZH TEKH FIZ+, V13, P114
[3]   PRINCIPLES OF BRAGG-FRESNEL MULTILAYER OPTICS [J].
ARISTOV, VV ;
ERKO, AI ;
MARTYNOV, VV .
REVUE DE PHYSIQUE APPLIQUEE, 1988, 23 (10) :1623-1630
[4]   HOLOGRAPHY OF MICROOBJECTS IN SOFT X-RAYS [J].
ARISTOV, VV ;
BASHKINA, GA ;
ERKO, AI .
OPTICS COMMUNICATIONS, 1980, 34 (03) :332-336
[6]   COMBINED MICROSTRUCTURE X-RAY OPTICS [J].
BARBEE, TW .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07) :1588-1595
[7]   SOFT-X-RAY MULTILAYER GRATINGS WITH SUBHALFMICRON PERIOD [J].
BERROUANE, H ;
ANDRE, JM ;
BARCHEWITZ, R ;
MALEK, CK ;
RIVOIRA, R .
OPTICS COMMUNICATIONS, 1990, 76 (02) :111-115
[8]  
Cornu M A., 1893, CR ACAD SCI, V117, P1032
[9]  
DENISYUK YN, 1963, OPT SPEKTROSK+, V15, P522
[10]  
Erko A I, 1990, J Xray Sci Technol, V2, P297, DOI 10.3233/XST-1990-2405