AUDIOFREQUENCY MEASUREMENT OF JFET NOISE VERSUS TEMPERATURE IN A HIGH-IMPEDANCE PREAMPLIFIER

被引：6

作者：

KLEIN, S

INNES, W

PRICE, JC

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1985年 / 56卷 / 10期

关键词：

D O I：

10.1063/1.1138531

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1941 / 1945

页数：5

共 13 条

[1]

AMBROZY A, 1982, ELECT NOISE, pCH3

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BORDONI, F ;

MAGGI, G ;

OTTAVIANO, A ;

PALLOTTINO, GV .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (07) :1079-1086

[3]

INNES W, 1983, SLAC PUB, V2938

[4] ANOMALOUS NOISE BEHAVIOR OF JUNCTION-GATE FIELD-EFFECT TRANSISTOR AT LOW TEMPERATURES [J].

KLAASSEN, FM ;

ROBINSON, JR .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1970, ED17 (10) :852-+

[5] TRANSISTOR RESET PRE-AMPLIFIER FOR HIGH-RATE HIGH-RESOLUTION SPECTROSCOPY [J].

LANDIS, DA ;

CORK, CP ;

MADDEN, NW ;

GOULDING, FS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (01) :619-624

[6] ENERGY-DEPENDENT LOSSES IN PULSED-FEEDBACK PRE-AMPLIFIERS [J].

LANDIS, DA ;

MADDEN, NW ;

GOULDING, FS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (01) :428-432

[7]

MATTHAI G, COMMUNICATION

[8]

NICHOLSON PW, 1974, NUCL ELECTRON, pCH5

[9] THEORY OF LOW-FREQUENCY GENERATION NOISE IN JUNCTION-GATE FIELD-EFFECT TRANSISTORS [J].

SAH, CT .

PROCEEDINGS OF THE IEEE, 1964, 52 (07) :795-+

[10] GATE NOISE IN FIELD EFFECT TRANSISTORS AT MODERATELY HIGH FREQUENCIES [J].

VANDERZIEL, A .

PROCEEDINGS OF THE IEEE, 1963, 51 (03) :461-&

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