AN INVESTIGATION OF THE FINE-STRUCTURE OF THE AL-K AND TI-K EDGES IN INTERMETALLIC COMPOUNDS USING ELECTRON-MICROSCOPY AND SYNCHROTRON-RADIATION

被引:7
作者
BLANCHE, G
JAOUEN, M
FLANK, AM
HUG, G
机构
[1] LAB MET PHYS,CNRS,UA 131,F-86022 POITIERS,FRANCE
[2] CTR UNIV PARIS SUD,CEA,MEN,UTILISAT RAYONNEMENT ELECTROMAGNET LAB,CNRS,F-91405 ORSAY,FRANCE
来源
JOURNAL DE PHYSIQUE IV | 1994年 / 4卷 / C9期
关键词
D O I
10.1051/jp4:1994922
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The extended fine structures of the aluminium and titanium K-edges of metals and intermetallics of the Ti-Al phase diagram are studied using both X-ray Absorption Spectrometry (XAS) and Electron Energy Loss Spectrometry (EELS). The Extended X-ray Absorption Fine Structure (EXAFS) and EXtended Electron Energy Loss Fine Structure (EXEELFS) in TiAl due to the first coordination shell are isolated and quantified using the standard method. For more accuracy, the phase and amplitude of backscattering are derived from the experimental measurements in pure metals (Al, Ti) and line compounds (Al3Ti, Ti3Al). Results from EXAFS and EXEELFS are in very good agreement. The analyzed volumes can be up to 10(7) time smaller with electrons, allowing the study of precipitates.
引用
收藏
页码:145 / 150
页数:6
相关论文
共 9 条
[1]   COMPARISON OF THE TI K EXTENDED FINE-STRUCTURE OBTAINED FROM ELECTRON-ENERGY-LOSS SPECTROSCOPY AND X-RAY-ABSORPTION SPECTROSCOPY [J].
BLANCHE, G ;
HUG, G ;
JOUEN, M ;
FLANK, AM .
ULTRAMICROSCOPY, 1993, 50 (02) :141-145
[2]   ELASTIC-CONSTANTS, FAULT ENERGIES, AND DISLOCATION REACTIONS IN TIAL - A 1ST-PRINCIPLES TOTAL-ENERGY INVESTIGATION [J].
FU, CL ;
YOO, MH .
PHILOSOPHICAL MAGAZINE LETTERS, 1990, 62 (03) :159-165
[3]  
HUG G, 1992, RT287228M TECHN REP
[4]   IMPROVED ABINITIO CALCULATIONS OF AMPLITUDE AND PHASE FUNCTIONS FOR EXTENDED X-RAY ABSORPTION FINE-STRUCTURE SPECTROSCOPY [J].
MCKALE, AG ;
VEAL, BW ;
PAULIKAS, AP ;
CHAN, SK ;
KNAPP, GS .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1988, 110 (12) :3763-3768
[5]  
MICHALOWICZ A, 1991, LOGICIELS CHIMIE, P102
[6]  
OKOMOTO JK, 1991, MICROBEAM ANAL, P273
[7]  
OKOMOTO JK, 1992, EELS ANAL ELECTRONIC, P183
[8]   EXELFS AS A STRUCTURAL TOOL FOR STUDIES OF LOW Z-ELEMENTS [J].
SERIN, V ;
ZANCHI, G ;
SEVELY, J .
MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1992, 3 (2-3) :201-212
[9]  
WOODWARD C, 1993, MAT RES S P, V228, P171