COMPARISON OF THE TI K EXTENDED FINE-STRUCTURE OBTAINED FROM ELECTRON-ENERGY-LOSS SPECTROSCOPY AND X-RAY-ABSORPTION SPECTROSCOPY

被引：13

作者：

BLANCHE, G

HUG, G

JOUEN, M

FLANK, AM

机构：

[1] CNRS,UA131,MET PHYS LAB,F-86022 POITIERS,FRANCE

[2] CTR UNIV PARIS SUD,MEN,CEA,CNRS,UTILISAT RAYONNEMENT ELECTROMAGNET LAB,F-91405 ORSAY,FRANCE

来源：

ULTRAMICROSCOPY | 1993年 / 50卷 / 02期

关键词：

D O I：

10.1016/0304-3991(93)90004-H

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The analysis of extended electron energy loss fine structure (EXEELFS) on the Ti K line in pure titanium is reported by using electron energy loss spectroscopy (EELS). Although the TiK edge at 4966 eV is well beyond the usual EELS domain, results of the analysis can be competitively compared to the equivalent extended X-ray absorption fine structures (EXAFS).

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页码：141 / 145

页数：5

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