CHARACTERIZATION OF THIN-FILMS OF BISMUTH OXIDE BY X-RAY PHOTO-ELECTRON SPECTROSCOPY

被引：218

作者：

DHARMADHIKARI, VS ^{[1
]}

SAINKAR, SR ^{[1
]}

BADRINARAYAN, S ^{[1
]}

GOSWAMI, A ^{[1
]}

机构：

[1] NATL CHEM LAB,POONA 411008,MAHARASHTRA,INDIA

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1982年 / 25卷 / 2-3期

关键词：

D O I：

10.1016/0368-2048(82)85016-0

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：181 / 189

页数：9

共 34 条

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