MODULATION SPECTROSCOPY UNDER UNIAXIAL STRESS

被引：105

作者：

POLLAK, FH ^{[1
]}

机构：

[1] YESHIVA UNIV, BELFER GRAD SCH SCI, DEPT PHYS, NEW YORK, NY 10033 USA

来源：

关键词：

D O I：

10.1016/0039-6028(73)90375-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：863 / 895

页数：33

共 58 条

[1] ANASTASSAKIS E, 1972, 11 P INT C PHYS SEM
[2] LINEARIZED THIRD-DERIVATIVE SPECTROSCOPY WITH DEPLETION-BARRIER MODULATION
ASPNES, DE
[J]. PHYSICAL REVIEW LETTERS, 1972, 28 (14) : 913 - &
[3] DIRECT EDGE PIEZO-REFLECTANCE IN GE AND GAAS
BALSLEV, I
[J]. SOLID STATE COMMUNICATIONS, 1967, 5 (04) : 315 - &
[4] BALSLEV I, 1971, SEMICONDUCTORS SEMIM, V8
[5] ELECTROREFLECTANCE SPECTRA OF GAAS AT HYDROSTATIC PRESSURE
BENDORIUS, R
SHILEIKA, A
[J]. SOLID STATE COMMUNICATIONS, 1970, 8 (14) : 1111 - +
[6] BENOITAL.C, 1972, PHYS REV B, V5, P4900, DOI 10.1103/PhysRevB.5.4900
[7] BIR GL, 1970, FIZ TVERD TELA+, V12, P926
[8] BIR GL, 1962, SOVIET PHYS SOLID ST, V3
[9] BIR GL, 1961, FIZ TVERD TELA, V3, P3050
[10] BROOKS H, 1955, ADV ELECTRONICS ELEC, V8