MODULATION SPECTROSCOPY UNDER UNIAXIAL STRESS

[41] PIEZO-OPTICAL EVIDENCE FOR LAMBDA TRANSITIONS AT 3.4-EV OPTICAL STRUCTURE OF SILICON [J]. PHYSICAL REVIEW LETTERS, 1972, 29 (12) : 789 - &

[42] PIEZOELECTROREFLECTANCE IN GAAS [J]. PHYSICAL REVIEW LETTERS, 1966, 16 (21) : 942 - &

[43] PIEZO-ELECTROREFLECTANCE IN GE GAAS AND SI [J]. PHYSICAL REVIEW, 1968, 172 (03): : 816 - &

[44] POLLAK FH, 1966, J PHYS SOC JPN, VS 21, P20

[45] EFFECTS OF UNIAXIAL STRESS ON FREE AND BOUND EXCITON IN GASB AT 1.7 DEGREES K [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (02): : 432 - &

[46] POLLAK FH, 1970, 10 P INT C PHYS SEM

[47] CALCULATION OF EXCHANGE ENERGY FOR EXCITONS IN 2-BODY MODEL [J]. PHYSICAL REVIEW B, 1971, 3 (02): : 433 - &

[48] STRESS-INDUCED EXCHANGE SPLITTING OF HYPERBOLIC EXCITONS IN GAAS [J]. PHYSICAL REVIEW LETTERS, 1969, 22 (18) : 933 - &

[49] STRAIN-SPLIT ENERGY BANDS IN SEMICONDUCTORS - GE [J]. PHYSICAL REVIEW, 1969, 178 (03): : 1240 - &

[50] SHUBNIKOV-DE HAAS EFFECT UNDER STRESS - NEW TOOL FOR DETERMINING DEFORMATION POTENTIALS AND BAND-STRUCTURE INFORMATION [J]. PHYSICAL REVIEW LETTERS, 1972, 29 (10) : 647 - +

[41] PIEZO-OPTICAL EVIDENCE FOR LAMBDA TRANSITIONS AT 3.4-EV OPTICAL STRUCTURE OF SILICON [J]. PHYSICAL REVIEW LETTERS, 1972, 29 (12) : 789 - &

[42] PIEZOELECTROREFLECTANCE IN GAAS [J]. PHYSICAL REVIEW LETTERS, 1966, 16 (21) : 942 - &

[43] PIEZO-ELECTROREFLECTANCE IN GE GAAS AND SI [J]. PHYSICAL REVIEW, 1968, 172 (03): : 816 - &

[44] POLLAK FH, 1966, J PHYS SOC JPN, VS 21, P20

[45] EFFECTS OF UNIAXIAL STRESS ON FREE AND BOUND EXCITON IN GASB AT 1.7 DEGREES K [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (02): : 432 - &

[46] POLLAK FH, 1970, 10 P INT C PHYS SEM

[47] CALCULATION OF EXCHANGE ENERGY FOR EXCITONS IN 2-BODY MODEL [J]. PHYSICAL REVIEW B, 1971, 3 (02): : 433 - &

[48] STRESS-INDUCED EXCHANGE SPLITTING OF HYPERBOLIC EXCITONS IN GAAS [J]. PHYSICAL REVIEW LETTERS, 1969, 22 (18) : 933 - &

[49] STRAIN-SPLIT ENERGY BANDS IN SEMICONDUCTORS - GE [J]. PHYSICAL REVIEW, 1969, 178 (03): : 1240 - &

[50] SHUBNIKOV-DE HAAS EFFECT UNDER STRESS - NEW TOOL FOR DETERMINING DEFORMATION POTENTIALS AND BAND-STRUCTURE INFORMATION [J]. PHYSICAL REVIEW LETTERS, 1972, 29 (10) : 647 - +