FAR INFRARED CHARACTERIZATION OF HG1-XCDXTE AND RELATED ELECTRONIC MATERIALS

被引：5

作者：

PERKOWITZ, S

机构：

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1985年 / 14卷 / 05期

关键词：

D O I：

10.1007/BF02654024

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：551 / 562

页数：12

共 9 条

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[2]

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[3]

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[5] FAR-INFRARED INTERBAND ABSORPTION IN HG1-XMNXTE [J].

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AMIRTHARAJ, PM ;

PERKOWITZ, S .

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[6] FAR-INFRARED STUDY OF FREE CARRIERS AND PLASMON-PHONON INTERACTION IN CDTE [J].

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[7]

PERKOWITZ S, 1983, INFRARED MILLIMETER, V8, P71

[8] FAR-INFRARED SPECTRUM OF CADMIUM TELLURIDE [J].

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