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A SIMPLE METHOD OF MEASURING THE THICKNESS OF SEMITHIN AND ULTRA-THIN SECTIONS

被引：16
作者：
BEDI, KS
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1987年 / 148卷
关键词：
D O I：
10.1111/j.1365-2818.1987.tb02858.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：107 / 111
页数：5
相关论文
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