ELECTRIC-FIELD-INDUCED RAMAN-SCATTERING - RESONANCE, TEMPERATURE, AND SCREENING EFFECTS

被引：32

作者：

SCHAFFLER, F ^{[1
]}

ABSTREITER, G ^{[1
]}

机构：

[1] TECH UNIV MUNICH,DEPT PHYS E16,D-8046 GARCHING,FED REP GER

来源：

PHYSICAL REVIEW B | 1986年 / 34卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.34.4017

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：4017 / 4025

页数：9

共 34 条

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[9]

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[10]

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