SECONDARY ION MASS-SPECTROMETRY OF LOW-TEMPERATURE SOLIDS

被引：98

作者：

MICHL, J

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 53卷 / SEP期

关键词：

D O I：

10.1016/0020-7381(83)85116-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：255 / 272

页数：18

共 63 条

[31] SECONDARY ION MASS-SPECTROMETRY OF MOLECULAR-SOLIDS - CLUSTER FORMATION DURING ION-BOMBARDMENT OF FROZEN WATER, BENZENE, AND CYCLOHEXANE [J].

LANCASTER, GM ;

HONDA, F ;

FUKUDA, Y ;

RABALAIS, JW .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1979, 101 (08) :1951-1958

[32]

LINDHARD J, 1964, MAT FYS MEDD DAN VID, V33

[33] SURFACE-CHEMISTRY IN ION-INDUCED DESORPTION [J].

MACFARLANE, RD .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 198 (01) :75-80

[34] PARTICLE-INDUCED DESORPTION MASS-SPECTROMETRY OF LARGE INVOLATILE BIOMOLECULES - SURFACE-CHEMISTRY IN THE HIGH-ENERGY SHORT-TIME DOMAIN [J].

MACFARLANE, RD .

ACCOUNTS OF CHEMICAL RESEARCH, 1982, 15 (09) :268-275

[35] SPUTTERING OF ORGANIC-MOLECULES [J].

MAGEE, CW .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 49 (02) :211-221

[36] SYMPOSIUM ON FAST ATOM AND ION INDUCED MASS-SPECTROMETRY OF NON-VOLATILE ORGANIC-SOLIDS [J].

MCNEAL, CJ .

ANALYTICAL CHEMISTRY, 1982, 54 (01) :A43-&

[37] EVIDENCE FOR MAGIC NUMBERS OF FREE LEAD-CLUSTERS [J].

MUHLBACH, J ;

SATTLER, K ;

PFAU, P ;

RECKNAGEL, E .

PHYSICS LETTERS A, 1982, 87 (08) :415-417

[38] EJECTION DYNAMICS AND ELECTRONIC PROCESSES GOVERNING SECONDARY PARTICLE-EMISSION IN SIMS [J].

MURRAY, PT ;

RABALAIS, JW .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1981, 103 (05) :1007-1013

[39]

NG CY, 1983, ADV CHEM PHYS, V52, P263

[40] SECONDARY-ION EMISSION PROBABILITY IN SPUTTERING [J].

NORSKOV, JK ;

LUNDQVIST, BI .

PHYSICAL REVIEW B, 1979, 19 (11) :5661-5665

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