OPTICALLY INDUCED ELECTROMAGNETIC-RADIATION FROM SEMICONDUCTOR SURFACES

被引:81
作者
ZHANG, XC [1 ]
DARROW, JT [1 ]
HU, BB [1 ]
AUSTON, DH [1 ]
SCHMIDT, MT [1 ]
THAM, P [1 ]
YANG, ES [1 ]
机构
[1] COLUMBIA UNIV,CTR TELECOMMUN RES,NEW YORK,NY 10027
关键词
D O I
10.1063/1.102952
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ultrafast electromagnetic radiation induced by a femtosecond laser beam from a semiconductor provides determination of the impurity doping concentration, carrier mobility, sign, and strength of the depletion field near the semiconductor surface.
引用
收藏
页码:2228 / 2230
页数:3
相关论文
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