REFRACTIVE-INDEX DISPERSION OF LIGHT-GUIDING THIN-FILMS BY A SPECTROSCOPICALLY EXTENDED DARK M-LINES METHOD - APPLICATION TO GARNET AND AMORPHOUS HYDROGENATED SILICON LAYERS

被引：1

作者：

OLIVIER, M

DANEL, JS

PEUZIN, JC

CHALLETON, D

BOUCHUT, P

机构：

来源：

THIN SOLID FILMS | 1982年 / 89卷 / 03期

关键词：

D O I：

10.1016/0040-6090(82)90602-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：295 / 296

页数：2

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[3]

TANAKA K, 1980, APPL PHYS LETT, V34, P672

[4] NEW METHOD FOR DETERMINING THIN-FILM REFRACTIVE-INDEX AND THICKNESS USING GUIDED OPTICAL WAVES [J].

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