COMPUTER-ANALYSIS OF ION ELASTIC BACKSCATTERING - AN ITERATIVE FITTING METHOD

[1] Andersen H. H., 1977, HYDROGEN STOPPING PO

[2] DEPTH PROFILING BY ION-BEAM SPECTROMETRY [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1982, 27 (04): : 183 - 195

[3] Chu WK., 1978, BACKSCATTERING SPECT

[4] ESKILDSEN SS, 1982, ION IMPLANTATION MET, P315

[5] APPLICATIONS OF SCATTERING SPECTROMETRY WITH FAST PROTONS (5-8MEV) AND HEAVY-IONS (15-25 MEV) TO SPECIAL ANALYSIS PROBLEMS [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 239 - 245

[6] ATOMIC CONCENTRATIONS OF BINARY COMPOUND THIN-FILMS ON ELEMENTAL SUBSTRATES DETERMINED BY RUTHERFORD BACKSCATTERING TECHNIQUES [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (03) : 1358 - 1364

[7] RAUHALA E, 1983, HUP227 U HELS REP SE

[8] BACKGROUND IN RUTHERFORD BACKSCATTERING SPECTRA - A SIMPLE FORMULA [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 204 (2-3): : 559 - 563

[9] Ziegler J. F, 1977, HELIUM STOPPING POWE

[10] ZIEGLER JF, 1976, ION BEAM SURFACE LAY, V1, P163

[1] Andersen H. H., 1977, HYDROGEN STOPPING PO

[2] DEPTH PROFILING BY ION-BEAM SPECTROMETRY [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1982, 27 (04): : 183 - 195

[3] Chu WK., 1978, BACKSCATTERING SPECT

[4] ESKILDSEN SS, 1982, ION IMPLANTATION MET, P315

[5] APPLICATIONS OF SCATTERING SPECTROMETRY WITH FAST PROTONS (5-8MEV) AND HEAVY-IONS (15-25 MEV) TO SPECIAL ANALYSIS PROBLEMS [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 239 - 245

[6] ATOMIC CONCENTRATIONS OF BINARY COMPOUND THIN-FILMS ON ELEMENTAL SUBSTRATES DETERMINED BY RUTHERFORD BACKSCATTERING TECHNIQUES [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (03) : 1358 - 1364

[7] RAUHALA E, 1983, HUP227 U HELS REP SE

[8] BACKGROUND IN RUTHERFORD BACKSCATTERING SPECTRA - A SIMPLE FORMULA [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 204 (2-3): : 559 - 563

[9] Ziegler J. F, 1977, HELIUM STOPPING POWE

[10] ZIEGLER JF, 1976, ION BEAM SURFACE LAY, V1, P163