LEED INVESTIGATIONS OF THE RH(111)-(2X2)-O SURFACE-STRUCTURE - MEASUREMENTS WITH A VIDEO ANALYZER IN THE PRESENCE OF SOME ELECTRON-BEAM DISORDERING OF THE ADSORBED LAYER

被引：31

作者：

WONG, PC

HUI, KC

ZHOU, MY

MITCHELL, KAR

机构：

来源：

SURFACE SCIENCE | 1986年 / 165卷 / 01期

关键词：

D O I：

10.1016/0039-6028(86)90658-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：L21 / L25

页数：5

共 21 条

[1] RELATIONS BETWEEN BOND LENGTHS AND BOND STRENGTHS IN OXIDE STRUCTURES [J].

ALLMANN, R .

MONATSHEFTE FUR CHEMIE, 1975, 106 (03) :779-793

[2] LOW-ENERGY ELECTRON-DIFFRACTION STRUCTURAL-ANALYSIS OF THE (2X2) OXYGEN OVERLAYER ON THE IRIDIUM(111) SURFACE [J].

CHAN, CM ;

WEINBERG, WH .

JOURNAL OF CHEMICAL PHYSICS, 1979, 71 (07) :2788-2792

[3]

CHRISTMANN K, 1979, J CHEM PHYS, V70, P4168, DOI 10.1063/1.438041

[4] DETERMINATION OF STRUCTURE OF C(2 BY 2) SULFUR OVERLAYERS ON NI(001) [J].

DEMUTH, JE ;

JEPSEN, DW ;

MARCUS, PM .

SURFACE SCIENCE, 1974, 45 (02) :733-739

[5]

Heinz T., 1995, LOW ENERGY ELECTRON, V14, P1421

[6] SPOT PROFILE ANALYSIS (LEED) OF DEFECTS AT SILICON SURFACES [J].

HENZLER, M .

SURFACE SCIENCE, 1983, 132 (1-3) :82-91

[7] CHEMISORPTION OF OXYGEN ON PLATINUM (111) SURFACES [J].

JOEBSTL, JA .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01) :347-350

[8] LOW-ENERGY ELECTRON-DIFFRACTION FOR SURFACE-STRUCTURE ANALYSIS [J].

JONA, F ;

STROZIER, JA ;

YANG, WS .

REPORTS ON PROGRESS IN PHYSICS, 1982, 45 (05) :527-585

[9] INSTRUMENTATION FOR LOW-ENERGY ELECTRON-DIFFRACTION [J].

LAGALLY, MG ;

MARTIN, JA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (10) :1273-1288

[10] DETERMINATION OF STRUCTURE OF ORDERED ADSORBED LAYERS BY ANALYSIS OF LEED SPECTRA [J].

MARCUS, PM ;

DEMUTH, JE ;

JEPSEN, DW .

SURFACE SCIENCE, 1975, 53 (DEC) :501-522

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