MASS AND ENERGY SPECTROMETER FOR SECONDARY ION ANALYSIS

被引：18

作者：

BAYLY, AR ^{[1
]}

MACDONALD, RJ ^{[1
]}

机构：

[1] AUSTRALIAN NATL UNIV,DEPT PHYS,CANBERRA 2600,ACT,AUSTRALIA

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1977年 / 10卷 / 01期

关键词：

D O I：

10.1088/0022-3735/10/1/019

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：79 / 85

页数：7

共 20 条

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[2]

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[3] ENERGY-DISTRIBUTIONS OF SECONDARY IONS [J].

BLAISE, G ;

SLODZIAN, G .

REVUE DE PHYSIQUE APPLIQUEE, 1973, 8 (02) :105-116

[4]

Brubaker W.M., 1968, ADV MASS SPECTROM, V4, P293

[5]

BUKHANOV VM, 1970, SOV PHYS-SOLID STATE, V12, P313

[6]

Dennis E., 1972, Radiation Effects, V13, P243, DOI 10.1080/00337577208231186

[7]

DENNIS E, 1972, THESIS AUSTRALIAN NA

[8] DETERMINATION OF TRANSMISSION CHARACTERISTICS IN MASS FILTERS [J].

EHLERT, TC .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (03) :237-&

EVANS, CA .

[10]

HONIG RE, 1974, ADV MASS SPECTROM, V6, P337