DISPLACEMENT OF THE INTENSITY PEAK IN NARROW BEAMS REFLECTED AT A DIELECTRIC INTERFACE

被引：31

作者：

NASALSKI, W ^{[1
]}

TAMIR, T ^{[1
]}

LIN, L ^{[1
]}

机构：

[1] POLYTECH UNIV,WEBER RES INST,DEPT ELECT ENGN & COMP SCI,BROOKLYN,NY 11201

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1988年 / 5卷 / 01期

关键词：

D O I：

10.1364/JOSAA.5.000132

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：132 / 140

页数：9

共 17 条

[1] GAUSSIAN-BEAM INTERACTION WITH A PLANAR DIELECTRIC INTERFACE [J].

ANTAR, YM ;

BOERNER, WM .

CANADIAN JOURNAL OF PHYSICS, 1974, 52 (11) :962-972

[2]

CARNIGLIA CK, 1977, J OPT SOC AM, V67, P703

[3] BEAM PHENOMENA AT AND NEAR CRITICAL INCIDENCE UPON A DIELECTRIC INTERFACE [J].

CHAN, CC ;

TAMIR, T .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1987, 4 (04) :655-663

[4] LONGITUDINAL AND TRANSVERSE DISPLACEMENTS OF A BOUNDED MICROWAVE BEAM AT TOTAL INTERNAL-REFLECTION [J].

COWAN, JJ ;

ANICIN, B .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (10) :1307-1314

[5] *EIN NEUER UND FUNDAMENTALER VERSUCH ZUR TOTALREFLEXION [J].

GOOS, F ;

HANCHEN, H .

ANNALEN DER PHYSIK, 1947, 1 (7-8) :333-346

[6]

GRADSHTEYN IS, 1980, TABLE INTEGRALS SERI, P1064

[7] LATERAL DISPLACEMENT OF A LIGHT BEAM AT A DIELECTRIC INTERFACE [J].

HOROWITZ, BR ;

TAMIR, T .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (05) :586-&

[8] GOOS-HANCHEN EFFECT AROUND AND OFF THE CRITICAL ANGLE [J].

LAI, HM ;

CHENG, FC ;

TANG, WK .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1986, 3 (04) :550-557

[9]

LOTSCH HKV, 1970, OPTIK, V32, P189

[10]

LOTSCH HKV, 1970, OPTIK, V32, P116

← 1 2 →