LONG-TERM TESTING OF 68 KBIT BUBBLE DEVICE CHIPS

[1] BLANK SL, 1976, J ELECTROCHEMICA JUN

[2] 68 KBIT CAPACITY 16 MUM-PERIOD MAGNETIC-BUBBLE MEMORY CHIP DESIGN WITH 2MUM-MINIMUM FEATURES [J]. IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (06) : 614 - 617

[3] BONYHARD PI, 1974, AIP C P, V18, P100

[4] SPONTANEOUS ANNIHILATIONS IN MAGNETIC-BUBBLE PROPAGATION [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (11) : 4970 - 4975

[5] CHEN TS, TO BE PUBLISHED

[6] CHEN TT, 1975, 21 ANN C MAGN MAGN M

[7] DOYLE WD, 1974, AIP C P, V18, P152

[8] DIAGNOSTIC TESTING OF A 10-KBIT BUBBLE MEMORY CHIP [J]. IEEE TRANSACTIONS ON MAGNETICS, 1975, 11 (06) : 1685 - 1688

[9] LIFETIME CHARACTERIZATION OF PROPAGATED BUBBLE-DATA STREAMS [J]. APPLIED PHYSICS LETTERS, 1973, 23 (04) : 204 - 205

[10] SHUMATE PW, 1974, AIP C P, V18, P140

[1] BLANK SL, 1976, J ELECTROCHEMICA JUN

[2] 68 KBIT CAPACITY 16 MUM-PERIOD MAGNETIC-BUBBLE MEMORY CHIP DESIGN WITH 2MUM-MINIMUM FEATURES [J]. IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (06) : 614 - 617

[3] BONYHARD PI, 1974, AIP C P, V18, P100

[4] SPONTANEOUS ANNIHILATIONS IN MAGNETIC-BUBBLE PROPAGATION [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (11) : 4970 - 4975

[5] CHEN TS, TO BE PUBLISHED

[6] CHEN TT, 1975, 21 ANN C MAGN MAGN M

[7] DOYLE WD, 1974, AIP C P, V18, P152

[8] DIAGNOSTIC TESTING OF A 10-KBIT BUBBLE MEMORY CHIP [J]. IEEE TRANSACTIONS ON MAGNETICS, 1975, 11 (06) : 1685 - 1688

[9] LIFETIME CHARACTERIZATION OF PROPAGATED BUBBLE-DATA STREAMS [J]. APPLIED PHYSICS LETTERS, 1973, 23 (04) : 204 - 205

[10] SHUMATE PW, 1974, AIP C P, V18, P140