DIAGNOSTIC TESTING OF A 10-KBIT BUBBLE MEMORY CHIP

被引：8

作者：

ORIHARA, S ^{[1
]}

IWASA, S ^{[1
]}

MAJIMA, T ^{[1
]}

NOGIWA, K ^{[1
]}

YAMAGISHI, K ^{[1
]}

机构：

[1] FUJITSU LABS LTD,KAWASAKI,JAPAN

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1975年 / 11卷 / 06期

关键词：

D O I：

10.1109/TMAG.1975.1058968

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1685 / 1688

页数：4

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