CORRECTION FOR INTERFERENCES OF SPECTRAL ORIGIN WITH CONTINUUM SOURCE, ECHELLE WAVELENGTH MODULATED ATOMIC-ABSORPTION SPECTROMETRY

被引:32
作者
ZANDER, AT
OHAVER, TC
KELIHER, PN
机构
[1] UNIV MARYLAND,DEPT CHEM,COLLEGE PK,MD 20742
[2] VILLANOVA UNIV,DEPT CHEM,VILLANOVA,PA 19085
关键词
D O I
10.1021/ac50014a043
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:838 / 841
页数:4
相关论文
共 22 条
[11]   IMPORTANCE OF SPECTRAL INTERFERENCES IN ATOMIC-ABSORPTION SPECTROSCOPY [J].
LOVETT, RJ ;
WELCH, DL ;
PARSONS, ML .
APPLIED SPECTROSCOPY, 1975, 29 (06) :470-477
[12]  
MARKS JY, 1975, 2ND NAT M FED AN CHE
[13]  
MARKS JY, 1976, 3RD ANN M FED AN CHE
[14]  
MEGGERS WF, 1975, NBS145 US MON
[15]  
OHAVER TC, 1976, TRACE ANALYSIS SPECT, pCH3
[16]  
Parsons M. L., 1975, HDB FLAME SPECTROSCO
[18]   AUTOMATIC BACKGROUND-CORRECTING SPECTROMETER [J].
SYDOR, RJ ;
SINNAMON, JT ;
HIEFTJE, GM .
ANALYTICAL CHEMISTRY, 1976, 48 (13) :2030-2033
[19]   APPLICATION OF A WIDE-SLOT NITROUS OXIDE NITROGEN ACETYLENE BURNER FOR ATOMIC-ABSORPTION SPECTROPHOTOMETRIC DETERMINATION OF ALUMINUM, ARSENIC AND TIN IN STEELS BY SINGLE-PULSE NEBULIZATION TECHNIQUE [J].
THOMPSON, KC ;
GODDEN, RG .
ANALYST, 1976, 101 (1199) :96-102
[20]   DIRECT DETERMINATION OF TRACE QUANTITIES OF LEAD, BISMUTH, SELENIUM, TELLURIUM, AND THALLIUM IN HIGH-TEMPERATURE ALLOYS BY NON-FLAME ATOMIC-ABSORPTION SPECTROPHOTOMETRY [J].
WELCHER, GG ;
KRIEGE, OH ;
MARKS, JY .
ANALYTICAL CHEMISTRY, 1974, 46 (09) :1227-1231