VACUUM TUNNELING PROBE - A NONRECIPROCAL, REDUCED-BACK-ACTION TRANSDUCER

被引：49

作者：

BOCKO, MF ^{[1
]}

STEPHENSON, KA ^{[1
]}

KOCH, RH ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW LETTERS | 1988年 / 61卷 / 06期

关键词：

D O I：

10.1103/PhysRevLett.61.726

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：726 / 729

页数：4

共 13 条

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[8]

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[9] USE OF A SCANNING TUNNELING MICROSCOPE TO RECTIFY OPTICAL FREQUENCIES AND MEASURE AN OPERATIONAL TUNNELING TIME [J].

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[10]

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