GRAZING-INCIDENCE X-RAY-DIFFRACTION CHARACTERIZATION OF CO-PT MAGNETOOPTICAL THIN-FILMS

被引:26
作者
HUANG, TC
SAVOY, R
FARROW, RFC
MARKS, RF
机构
[1] IBM Research Division, Almaden Research Center, San Jose
关键词
D O I
10.1063/1.108676
中图分类号
O59 [应用物理学];
学科分类号
摘要
The microstructures of epitaxial CoxPt1-x films (x almost-equal-to 0.25 and 0.5) and the orientation relationships with sapphire (0001) single-crystal substrates were determined by grazing-incidence x-ray diffraction. The epitaxial relationships between the CoPt3 film and its substrate are CoPt3[110BAR] parallel-to Al2O3[3030BAR] and CoPt3(111) parallel-to Al2O3(0001). A significant amount of the ordered L1(2) phase was detected in CoPt3. The degree of long-range order in CoPt3 was 0.3, and the average domain size of the ordered phase was 80 angstrom. The CoPt film had two domains related by a 30-degrees in-plane rotation. The epitaxial relationships between the CoPt film and its substrate were CoPt[100] parallel-to Al2O3[3030BAR] and CoPt(011) parallel-to Al2O3(0001) for domain A and CoPt[100] parallel-to Al2O3[1120BAR] and CoPt(011) parallel-to Al2O3(0001) for domain B. Domain A was found to be dominant and/or had a higher degree of long-range order than domain B.
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页码:1353 / 1355
页数:3
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