INVESTIGATING ATOMIC-SCALE STRUCTURES GENERATED WITH THE STM

被引:18
作者
FUCHS, H [1 ]
SCHIMMEL, T [1 ]
LUXSTEINER, M [1 ]
BUCHER, E [1 ]
机构
[1] UNIV CONSTANCE,W-7750 CONSTANCE,GERMANY
关键词
D O I
10.1016/0304-3991(92)90438-P
中图分类号
TH742 [显微镜];
学科分类号
摘要
We report recent progress in the generation of stable surface modifications with preserved atomic order with the STM. The writing of well defined atomic-scale structures on dichalcogenides is demonstrated not only in air but also under UHV conditions, indicating that the process is not dominated by chemical reactions. Experimental results and computer simulations are presented ruling out superstructure formation as a potential origin of the preserved atomic order observed within the modified areas.
引用
收藏
页码:1295 / 1302
页数:8
相关论文
共 23 条
  • [1] NANOMETER-SCALE HOLE FORMATION ON GRAPHITE USING A SCANNING TUNNELING MICROSCOPE
    ALBRECHT, TR
    DOVEK, MM
    KIRK, MD
    LANG, CA
    QUATE, CF
    SMITH, DPE
    [J]. APPLIED PHYSICS LETTERS, 1989, 55 (17) : 1727 - 1729
  • [2] BUCHER E, UNPUB
  • [3] LARGE-SCALE PERIODIC FEATURES ASSOCIATED WITH SURFACE BOUNDARIES IN SCANNING TUNNELING MICROSCOPE IMAGES OF GRAPHITE
    BUCKLEY, JE
    WRAGG, JL
    WHITE, HW
    BRUCKDORFER, A
    WORCESTER, DL
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1079 - 1082
  • [4] POSITIONING SINGLE ATOMS WITH A SCANNING TUNNELING MICROSCOPE
    EIGLER, DM
    SCHWEIZER, EK
    [J]. NATURE, 1990, 344 (6266) : 524 - 526
  • [5] CHARACTERIZATION OF GOLD SURFACES FOR USE AS SUBSTRATES IN SCANNING TUNNELING MICROSCOPY STUDIES
    EMCH, R
    NOGAMI, J
    DOVEK, MM
    LANG, CA
    QUATE, CF
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) : 79 - 84
  • [6] Feynman R.P., 1961, MINIATURIZATION, P282, DOI DOI 10.1201/9781315217178
  • [7] ATOMIC RESOLUTION OF NANOMETER SCALE PLASTIC SURFACE DEFORMATIONS BY SCANNING TUNNELING MICROSCOPY
    FUCHS, H
    LASCHINSKI, R
    SCHIMMEL, T
    [J]. EUROPHYSICS LETTERS, 1990, 13 (04): : 307 - 311
  • [8] ATOMIC SITES OF A BARE SURFACE MODIFIED WITH THE TUNNELING MICROSCOPE
    FUCHS, H
    SCHIMMEL, T
    [J]. ADVANCED MATERIALS, 1991, 3 (02) : 112 - 113
  • [9] SURFACE INVESTIGATIONS WITH A COMBINED SCANNING ELECTRON SCANNING TUNNELING MICROSCOPE
    FUCHS, H
    LASCHINSKI, R
    [J]. SCANNING, 1990, 12 (03) : 126 - 132
  • [10] FUCHS H, UNPUB