BACKSCATTERING MEASUREMENTS ON AG PHOTODOPING EFFECT IN AS2S3 GLASS

被引：52

作者：

YAMAMOTO, Y

ITOH, T

HIROSE, Y

HIROSE, H

机构：

[1] WASEDA UNIV,SCH SCI & ENGN,TOKYO 160,JAPAN

[2] NIPPON INST TECHNOL,DEPT ELECT ENGN,SAITAMA 345,JAPAN

来源：

JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 08期

关键词：

D O I：

10.1063/1.323165

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3603 / 3608

页数：6

共 17 条

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[5] MEMORY SWITCHING PHENOMENA IN THIN-FILMS OF S-SE-TE SYSTEM [J].

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[6]

HIROSE Y, TO BE PUBLISHED

[7]

Igo T., 1973, Journal of Non-Crystalline Solids, V11, P304, DOI 10.1016/0022-3093(73)90019-7

[8]

Inoue, COMMUNICATION

[9]

INOUE E, 1973, 5TH P C SOL STAT DEV, P101

[10] ANALYSIS OF RADIATION-ENHANCED DIFFUSION OF ALUMINUM IN SILICON [J].

ITOH, T ;

OHDOMARI, I .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (01) :434-&

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