共 16 条
- [1] ALSTRUP O, 1975, ACTA CRYSTALLOGR A, V31, pS234
- [3] X-RAY ENERGY-DISPERSIVE POWDER DIFFRACTOMETRY USING SYNCHROTRON RADIATION [J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 135 (01): : 193 - 195
- [4] ENERGY-DISPERSIVE SPECTROSCOPIC METHODS APPLIED TO X-RAY-DIFFRACTION IN SINGLE-CRYSTALS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1975, A 31 (MAY1): : 327 - 333
- [5] RELATIONS BETWEEN INTEGRATED-INTENSITIES IN CRYSTAL DIFFRACTION METHODS FOR X-RAYS AND NEUTRONS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1975, A 31 (MAY1): : 372 - 374
- [6] Buras B., 1963, NUKLEONIKA, V8, P259
- [7] APPLICATION OF SEMICONDUCTOR DETECTORS IN CRYSTAL STRUCTURE INVESTIGATIONS [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1971, 4 (03): : 619 - +
- [8] APPLICATIONS OF SYNCHROTRON RADIATION [J]. REPORTS ON PROGRESS IN PHYSICS, 1973, 36 (05) : 541 - +
- [9] COVALENT BOND IN SILICON [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1455): : 379 - &
- [10] PRECISION OF INTERPLANAR DISTANCES MEASURED BY AN ENERGY-DISPERSIVE DIFFRACTOMETER [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (APR1): : 117 - 122