ENERGY-DISPERSIVE SPECTROSCOPIC METHODS APPLIED TO X-RAY-DIFFRACTION IN SINGLE-CRYSTALS

被引：44

作者：

BURAS, B

OLSEN, JS

GERWARD, L

SELSMARK, B

LINDEGAARDANDERSEN, A

机构：

[1] UNIV COPENHAGEN,HC ORSTED INST,PHYS LAB 2,DK-2100 COPENHAGEN,DENMARK

[2] TECH UNIV DENMARK,LAB APPL PHYS 3,BLDG 307,DK-2800 LYNGBY,DENMARK

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1975年 / A 31卷 / MAY1期

关键词：

D O I：

10.1107/S0567739475000691

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：327 / 333

页数：7

共 15 条

[1]

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OLSEN, JS ;

ANDERSEN, AL ;

GERWARD, L ;

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JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (APR1) :296-297

[3]

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[4]

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[7] ESCAPE PEAKS CAUSED BY A GE(LI) DETECTOR IN AN ENERGY-DISPERSIVE DIFFRACTOMETER [J].

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HOSOYA, S .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (AUG1) :297-298

[8] X-RAY DIFFRACTION - NEW HIGH-SPEED TECHNIQUE BASED ON X-RAY SPECTROGRAPHY [J].

GIESSEN, BC ;

GORDON, GE .

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[9]

HEATH RL, 1972, ADV XRAY ANAL, V15, P1

[10]

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