DIGITAL-TECHNIQUES FOR IMPROVED VOLTAGE MEASUREMENTS

被引:4
作者
NYE, P
DINNIS, AR
机构
关键词
D O I
10.1002/sca.4950070303
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:113 / 116
页数:4
相关论文
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ARTHUR JW, 1980, IEEE T INSTRUMENTATI, V29
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Gilhooley B., 1983, Microscopy of Semiconducting Materials 1983. 3rd Oxford Conference, P427
[3]   SECONDARY-ELECTRON DETECTION SYSTEMS FOR QUANTITATIVE VOLTAGE MEASUREMENTS [J].
MENZEL, E ;
KUBALEK, E .
SCANNING, 1983, 5 (04) :151-171
[4]  
Ranasinghe D. W., 1983, Microscopy of Semiconducting Materials 1983. 3rd Oxford Conference, P433