LOCATION OF OXYGEN IN LEACHED UO2 SINGLE-CRYSTALS BY RESONANT SCATTERING OF HE IONS

被引：12

作者：

TUROS, A ^{[1
]}

MATZKE, H ^{[1
]}

CHAUMONT, J ^{[1
]}

THOME, L ^{[1
]}

机构：

[1] CTR SPECTROMETRIE NUCL & SPECTROMETRIE MASSE,INST NATL PHYS NUCL & PHYS PARTICULES,CNRS,F-91405 ORSAY,FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1992年 / 66卷 / 1-2期

关键词：

D O I：

10.1016/0168-583X(92)96164-T

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The resonant O-16(alpha, alpha)O-16 scattering was successfully used to determine the depth and lattice location of 0 atoms in UO2 single crystals subjected to leaching. The results indicate that the transformed region has a O content approximately 20% higher than that in the virgin crystal. Moreover, the channeling dips for oxygen could be measured precisely enough to show that the lattice positions of oxygen atoms in the leached layer differ from those in the bulk material, as would be expected for the formation of higher oxides (U3O7, U2O5).

引用

页码：280 / 282

页数：3

共 5 条

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[5] MATZKE H, IN PRESS SOLID STATE

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