APPLICATION OF CHARGED-PARTICLE ACTIVATION-ANALYSIS TO TRACE CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS

被引：10

作者：

SCHWEIKERT, EA

MCGINLEY, JR

FRANCIS, G

SWINDLE, DL

机构：

[1] TEXAS A&M UNIV, ACTIVATION ANAL RES LAB, COLLEGE STN, TX 77843 USA

[2] TEXAS A&M UNIV, CHEM DEPT, COLLEGE STN, TX 77843 USA

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1974年 / 19卷 / 01期

关键词：

D O I：

10.1007/BF02515270

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：89 / 108

页数：20

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