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A SIMPLE METHOD FOR THE DIRECT MEASUREMENT OF DIFFRACTION PATTERNS IN THE EM400T TRANSMISSION ELECTRON-MICROSCOPE

被引：6
作者：
TAMBUYSER, P
机构：
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1983年 / 16卷 / 06期
关键词：
D O I：
10.1088/0022-3735/16/6/010
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：483 / 486
页数：4
相关论文
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[3]   METHOD FOR ACCURATELY DETERMINING LATTICE-PARAMETERS USING ELECTRON-DIFFRACTION IN A COMMERCIAL ELECTRON-MICROSCOPE [J].
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[4]   DIGITAL SCANNING AND RECORDING-SYSTEM FOR SPOT ELECTRON-DIFFRACTION PATTERNS [J].
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[5]  
THOMAS G, 1979, TRANSMISSION ELECTRO, P33
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