共 10 条
[3]
IMPROVEMENT OF SENSITIVITY OF ELECTRON-ENERGY LOSS SPECTROSCOPY
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS,
1983, 22 (03)
:L173-L175
[4]
CAF2/SI(111) - THIN-FILM CHARACTERIZATION BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
[J].
PHYSICAL REVIEW B,
1986, 34 (10)
:7471-7474
[5]
PHOTOEMISSION-STUDY OF BONDING AT THE CAF2-ON-SI(111) INTERFACE
[J].
PHYSICAL REVIEW B,
1987, 35 (14)
:7526-7532
[6]
ELECTRONIC-STRUCTURE OF THE CAF2/SI(111) INTERFACE
[J].
PHYSICAL REVIEW B,
1986, 34 (10)
:7295-7306
[8]
LOW-ENERGY ELECTRON-ENERGY LOSS SPECTROSCOPY ON CAF2(111) SURFACES
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS,
1987, 26 (06)
:L974-L977
[9]
SHOWALTER LJ, 1986, J VAC SCI TECHNOL A, V4, P1026
[10]
SHOWALTER LJ, 1985, J APPL PHYS, V58, P302