A STATISTICAL-MODEL INCLUDING PARAMETER MATCHING FOR ANALOG INTEGRATED-CIRCUITS SIMULATION

被引：8

作者：

INOHIRA, S ^{[1
]}

SHINMI, T ^{[1
]}

NAGATA, M ^{[1
]}

TOYABE, T ^{[1
]}

IIDA, K ^{[1
]}

机构：

[1] HITACHI LTD,TAKASAKI WORKS,TAKASAKI,GUNMA 37011,JAPAN

来源：

关键词：

D O I：

10.1109/TCAD.1985.1270162

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：621 / 628

页数：8

共 12 条

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DIVEKAR, DA
DUTTON, RW
MCCALLA, WJ
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[6] INOHIRA S, 1982, SEP S VLSI TECHN
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[9] CHARACTERIZATION AND MODELING FOR STATISTICAL DESIGN
LOGAN, J
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1971, 50 (04): : 1105 - +
[10] Maly W., 1982, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, VCAD-1, P120, DOI 10.1109/TCAD.1982.1270003