A NON-QUASI-STATIC ANALYSIS OF THE TRANSIENT-BEHAVIOR OF THE LONG-CHANNEL MOST VALID IN ALL REGIONS OF OPERATION

被引:20
作者
MANCINI, P [1 ]
TURCHETTI, C [1 ]
MASETTI, G [1 ]
机构
[1] UNIV ANCONA,DEPT ELECTR,I-60100 ANCONA,ITALY
关键词
D O I
10.1109/T-ED.1987.22926
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:325 / 334
页数:10
相关论文
共 18 条
[1]   A SMALL-SIGNAL DC-TO-HIGH-FREQUENCY NONQUASISTATIC MODEL FOR THE 4-TERMINAL MOSFET VALID IN ALL REGIONS OF OPERATION [J].
BAGHERI, M ;
TSIVIDIS, Y .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (11) :2383-2391
[2]  
BREWS JR, 1981, SILICON INTEGRATED A
[3]  
BURNS JR, 1969, RCA REV, V15, P15
[4]  
KLAASSEN FM, 1976, PHILIPS RES REP, V3, P71
[5]  
KUO J, 1986, FEB P INT SOL STAT C
[6]  
MANCINI P, 1985, THESIS U ANCONA ITAL
[7]  
MEYER JE, 1971, RCA REV, V32, P42
[8]   LARGE-SIGNAL AND SMALL-SIGNAL CHANNEL TRANSIT-TIME DELAYS IN LONG-CHANNEL MOS-TRANSISTORS [J].
MIKAMI, Y ;
THOMAS, RE .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (02) :99-107
[9]   TRANSIENT ANALYSIS OF MOS-TRANSISTORS [J].
OH, SY ;
WARD, DE ;
DUTTON, RW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (08) :1571-1578
[10]  
OH SY, 1981, G20110 STANF U REP